Renishaw SP25

The SP25 Analog Scanning Probe from Renishaw provides tactile touch-trigger and tactile scanning from a single probe system. High-density data collection, for quick and precise form evaluation of geometric and irregular shapes. Compatible with all Renishaw Auto-Joint probe heads and many popular DCC CMM controllers.

Tackle the most demanding high speed, complex measurements with familiar software. With CMM-Manager’s world-renowned path-planning, the software user picks features, curves, surfaces or sections from 3D CAD and the scanning path is created for you.

Renishaw SP25 analog scanning probe with CMM-Manager

SP25 Advantages and Details

  • Compact and Indexing Probe – wide measuring range – 20mm to 400mm reach
  • Automatic Probe Module Swap using Renishaw ACR3 or FCR25 Probe Stations
  • Pick from CAD to Measure
  • Full Automatic Path Planning and Collision Avoidance
  • Graphical Reports Provide Highest Level of Insight
  • High Point Density Yields Improved Form and Cloud Comparison Reports
  • Statistical and Frequency Based Raw Point FIltering

Technical Specifications

  • Resolution < 0.1 um
  • Compatible CMM Controllers
    • LK / Nikon – NMC 300+
    • Sheffield – SMP
    • Wenzel – Pantec
    • Mitutoyo – UC200, 300 & 400
    • Renishaw – UCC – S3
    • I++ / DME
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