Scanning Probe from Renishaw provides tactile touch-trigger and tactile scanning from a single probe system. High-density data collection, for quick and precise form evaluation of geometric and irregular shapes. Compatible with all Renishaw Auto-Joint probe heads and many popular DCC CMM controllers.
SP25 Advantages and Details
- Compact and Indexing Probe – wide measuring range – 20mm to 400mm reach
- Automatic Probe Module Swap – using Renishaw ACR3 or FCR25 Probe Stations
- Pick from CAD to Measure
- Full Automatic Path Planning and Collision Avoidance
- Graphical Reports Provide Highest Level of Insight
- High Point Density Yields Improved Form and Cloud Comparison Reports
- Statistical and Frequency Based Raw Point FIltering
Technical Specifications
- Resolution < 0.1 μm
- Compatible CMM Controllers
- LK / Nikon – NMC 300+
- Sheffield – SMP
- Wenzel – Pantec
- Mitutoyo – UC200, 300 & 400
- Renishaw – UCC – S3
- I++ / DME
